Materials, Vol. 11, Pages 863: Modeling the Effect of Primary and Secondary Twinning on Texture Evolution during Severe Plastic Deformation of a Twinning-Induced Plasticity Steel (Materials)

Modeling the effect of deformation twinning and the ensuing twin-twin- and slip-twin-induced hardening is a long-standing problem in computational mechanical metallurgy of materials that deform by both slip and twinning. In this work, we address this effect using the twin volume transfer method, which obviates the need of any cumbersome criterion for twin variant selection. Additionally, this method is capable of capturing, at the same time, secondary or double twinning, which is particularly important for modeling in large strain regimes. We validate our modeling methodology by simulating the behavior of an Fe-23Mn-1.5Al-0.3C twinning-induced plasticity (TWIP) steel under large strain conditions, experimentally achieved in this work through equal-channel angular pressing (ECAP) for up to two passes in a 90° die following route BC at 300 °C. Each possible twin variant, whether nucleating inside the parent grain or inside a potential primary twin variant was predefined in the initial list of orientations as possible grain of the polycrystal with zero initial volume fraction. A novelty of our approach is to take into account the loss of coherency of the twins with their parent matrix under large strains, obstructing progressively their further growth. This effect has been captured by attenuating growth rates of twins as a function of their rotation away from their perfect twin orientation, dubbed here as “disorientation” with respect to the mother grain’s lattice. The simulated textures and the hardening under tensile strain showed very good agreement with experimental characterization and mechanical testing results. Furthermore, upper-bound Taylor deformation was found to be operational for the TWIP steel deformation when all the above ingredients of twinning are captured, indicating that self-consistent schemes can be bypassed.