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[ASAP] Atomic-Scale Characterization of N-Doped Si Nanocrystals Embedded in SiO2 by Atom Probe Tomography
(Journal of Physical Chemistry C)
20 march 2019 00:01:08
[ASAP] Atomic-Scale Characterization of N-Doped Si Nanocrystals Embedded in SiO2 by Atom Probe Tomography
(Journal of Physical Chemistry C)
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The Journal of Physical Chemistry CDOI: 10.1021/acs.jpcc.8b08620
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Sensors, Vol. 19, Pages 1376: On the Use of Microwave Holography to Detect Surface Defects of Rails and Measure the Rail Profile
(Sensors)
[ASAP] Probable Transmembrane Amyloid a-Helix Bundles Capable of Conducting Ca2+ Ions
(Journal of Physical Chemistry B)
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