Qualitative Analyses of Polishing and Precoating FIB Milled Crystals for MicroED (Structure)

Low-current ion-beam polishing and precoating of crystals with a thin platinum layer are investigated and found to improve MicroED data quality. Low-dose merged structures from either coated or uncoated crystals are solved using a total exposure of only 1.5 e- Å-2, and result in further improved data and structure quality.