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16 september 2020 22:21:26

 
[ASAP] Numerical Simulation of an Entire Wafer Surface during Ozone-Based Wet Chemical Etching (Industrial & Engineering Chemistry Research)
 


Industrial & Engineering Chemistry ResearchDOI: 10.1021/acs.iecr.0c03382


 
213 viewsCategory: Chemistry
 
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[ASAP] The Role of Nitroxide Degradation on the Efficiency of the Controller in Nitroxide-Mediated Radical Polymerization (NMP) of Styrene (Industrial & Engineering Chemistry Research)
 
 
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