Physics
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30 july 2015 18:51:06 |
| Combining 2 nm Spatial Resolution and 0.02% Precision for Deformation Mapping of Semiconductor Specimens in a Transmission Electron Microscope by Precession Electron Diffraction (Nano Letters) |
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Tweet Nano LettersDOI: 10.1021/acs.nanolett.5b01614
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| 99 viewsCategory: Physics |
 Commercializing plasmonics (Nature Photonics)Hybridization in Three Dimensions: A Novel Route toward Plasmonic Metamolecules (Nano Letters) 
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