Tension and adhesion regulated retraction of injured axons (Biophysical Journal)

Damage-induced retraction of axons during traumatic brain injury (TBI) is believed to play a key role in the disintegration of the neural network and eventually lead to severe symptoms such as permanent memory loss and emotional disturbances. However, fundamental questions such as how axon retraction progresses and what physical factors govern this process still remain unclear. Here, we report a combined experimental and modeling study to address these questions. Specifically, a sharp atomic force microscope (AFM) probe was used to transect axons and trigger their retraction in a precisely controlled manner.