Sensors, Vol. 19, Pages 4046: Geometric Aberration Theory of Offner Imaging Spectrometers (Sensors)

A third-order aberration theory has been developed for the Offner imaging spectrometer comprising an extended source; two concave mirrors; a convex diffraction grating; and an image plane. Analytic formulas of the spot diagram are derived for tracing rays through the system based on Fermat’s principle. The proposed theory can be used to discuss in detail individual aberrations of the system such as coma, spherical aberration and astigmatism, and distortion together with the focal conditions. It has been critically evaluated as well in a comparison with exact ray tracing constructed using the commercial software ZEMAX. In regard to the analytic formulas, the results show a high degree of practicality.